Abstract :
The following topics are dealt with: power analysis; formal methods; system level validation; functional validation and ATPG; AMS verification; and functional modeling.
Keywords :
automatic test pattern generation; formal verification; AMS verification; ATPG; formal methods; functional modeling; functional validation; power analysis; system level validation;
Conference_Titel :
Microprocessor Test and Verification, 2007. MTV '07. Eighth International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
978-0-7695-3241-7
