Title :
Anisotropy of electron mobility in arbitrarily oriented FinFETs
Author :
Gámiz, Francisco ; Donetti, Luca ; Rodriguez, Noel
Author_Institution :
Univ. de Granada, Granada
Abstract :
We simulated the behavior of electron mobility and the effect of volume inversion in FinFETs with different surface (hkl) orientations and channel <hkl> directions, using a Monte Carlo simulator. For each surface orientation, different channel directions were also considered. In the case of the (110) surface, a strong anisotropy of electron mobility with channel direction was seen: when the channel was in the (110)/<001> direction, electron mobility was 50% higher than in (110)/<1-10>, and was similar to the mobility for a (100)/<001> direction. This anisotropic behavior with channel orientation was not observed in the (100)-or (111)-surface orientations. The study with silicon thickness also revealed some interesting consequences of the volume inversion effect.
Keywords :
MOSFET; Monte Carlo methods; electron mobility; semiconductor device models; silicon; Monte Carlo simulator; Si; anisotropy; arbitrarily oriented FinFET; channel directions; electron mobility; silicon thickness; surface orientations; volume inversion effect; Anisotropic magnetoresistance; Computational modeling; Crystallography; Effective mass; Electron mobility; FinFETs; Monte Carlo methods; Poisson equations; Quantization; Silicon;
Conference_Titel :
Solid State Device Research Conference, 2007. ESSDERC 2007. 37th European
Conference_Location :
Munich
Print_ISBN :
978-1-4244-1123-8
Electronic_ISBN :
1930-8876
DOI :
10.1109/ESSDERC.2007.4430957