DocumentCode
2781393
Title
Theoretical analysis of XtreMOS™ power transistors
Author
Roig, J. ; Desoete, B. ; Moens, P. ; Tack, M.
Author_Institution
AMI Semicond. Belgium BVBA, Oudenaarde
fYear
2007
fDate
11-13 Sept. 2007
Firstpage
422
Lastpage
425
Abstract
This work provides a new theoretical approach addressed to the XtreMOSTM and equivalent structures. An analytical sRonxBVdss model is provided to demonstrate the superior electrical performance of XtreMOSTM structure in the domain of the high power MOSFETs at medium voltage capability (50-200 V). Moreover, geometrical and technological parameters can be easily optimized by means of simple expressions. In order to support and validate the theoretical approach, numerical simulation and experimental data are included.
Keywords
equivalent circuits; power transistors; XtreMOSTM; equivalent structures; geometrical parameters; high power MOSFET; medium voltage capability; power transistors; technological parameters; voltage 50 V to 200 V; Ambient intelligence; Analytical models; Dielectric breakdown; Electric breakdown; MOSFETs; Performance analysis; Power transistors; Silicon; Technological innovation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 2007. ESSDERC 2007. 37th European
Conference_Location
Munich
ISSN
1930-8876
Print_ISBN
978-1-4244-1123-8
Electronic_ISBN
1930-8876
Type
conf
DOI
10.1109/ESSDERC.2007.4430968
Filename
4430968
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