DocumentCode :
2781533
Title :
Test-to-failure of PV modules: Hotspot testing
Author :
Mathew, Janu K. ; Kuitche, Joseph ; TamizhMani, Govindasamy
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
fYear :
2010
fDate :
20-25 June 2010
Abstract :
The primary goal in the qualification testing is to identify the short-term reliability issues in the field. The primary goal in the accelerated reliability or lifetime testing is to identify the initial, operational and ultimate reliability issues in the field so that the lifetime can be predicted and warranty can be protected. The test-to-failure (TTF) testing is a compromise and it falls between these two extremes of qualification testing and lifetime/reliability testing. One of the major reliability issues of photovoltaic modules in the field is the hotspot endurance. A TTF study involving hotspot stress along with thermal cycling stress is undertaken and is presented in this paper.
Keywords :
failure analysis; life testing; photovoltaic cells; reliability; solar cells; warranties; accelerated reliability; hotspot testing; lifetime testing; photovoltaic module; short term reliability issue; test-to-failure testing; thermal cycling stress; warranty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5616895
Filename :
5616895
Link To Document :
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