DocumentCode
2781584
Title
Effects of load connection in accelerated aging of a-Si:H solar cell for long term reliability test
Author
Park, Sang Hyun ; Kim, Kyung Min ; Cho, Jun-Sik ; Lee, Jeong Chul ; Kang, Gi-Hwan ; Choi, Duck-Kyun ; Yoon, Kyung Hoon ; Song, Jinsoo
Author_Institution
Photovoltaic Res. Center, Korean Inst. of Energy Res., Daejeon, South Korea
fYear
2010
fDate
20-25 June 2010
Abstract
To establish reliable model for long term reliability of a-Si:H PV module, outdoor field aging results and indoor light soaking test has been investigated. For the appropriate comparisons, one type of outdoor system modules and test cells has been fabricated from the same commercial module production line. Severe early stage degradation in outdoor site has been resulted and compared to the indoor aging results. Detailed experiment of indoor aging tests depends on both load condition and cell temperature has been investigated.
Keywords
ageing; amorphous semiconductors; elemental semiconductors; hydrogen; reliability; silicon; solar cells; PV module; Si:H; accelerated aging; amorphous solar cell; cell temperature; commercial module production line; indoor light soaking test; load connection effect; long term reliability test; outdoor field aging; outdoor system modules;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5616898
Filename
5616898
Link To Document