Title :
Multilook SAR from measurements partitioned based on synthetic sensor parameters
Author :
Akers, Geoffrey A. ; Stiles, James M.
Author_Institution :
Grad. Sch. of Eng. & Manage., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
Abstract :
The balance between spatial resolution and the speckle in multilook SAR imaging may be improved by intelligently partitioning measurements of a sparsely populated, nonuniform, three-dimensional receiver array. This paper presents an approach to partitioning measurements from a single transmitter and multiple coherenet receivers using previously developed two-dimensional synthetic sensor locations based on eigen analysis of first-order Taylor expansions of the sensor measurement parameters. The approach is general and is demonstrated using simulated data for a nonuniformly-spaced two-dimensional sidelooking array and low time-bandwidth product.
Keywords :
eigenvalues and eigenfunctions; radar imaging; synthetic aperture radar; eigen analysis; first-order Taylor expansions; low time bandwidth product; multilook SAR imaging; multiple coherenet receivers; nonuniformly spaced two-dimensional sidelooking array; sensor measurement parameter; synthetic aperture radar; synthetic sensor parameters; three-dimensional receiver array; two-dimensional synthetic sensor location; Antenna arrays; Antenna measurements; Force measurement; Frequency; Intelligent sensors; Radar imaging; Radar scattering; Sensor arrays; Spatial resolution; Transmitters;
Conference_Titel :
Radar Conference, 2010 IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-5811-0
DOI :
10.1109/RADAR.2010.5494455