DocumentCode :
2781838
Title :
Failure Modes & Effective Analysis And Continuous Improvement
Author :
Hatty, Mark ; Owens, Norm
Author_Institution :
Motorola Inc.
fYear :
1992
fDate :
28-30 Sep 1992
Firstpage :
246
Lastpage :
248
Keywords :
Aerospace industry; Chemical industry; Continuous improvement; Electronic packaging thermal management; Electronics industry; Failure analysis; Manufacturing processes; Microassembly; Process design; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN :
0-7803-0755-0
Type :
conf
DOI :
10.1109/IEMT.1992.639899
Filename :
639899
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2781838
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