Title :
Breakdown Mechanism Of Plasma Polymerized Ethylene Thin Film
Author :
Ishii, Keisuke ; Ohki, Yoshimichi
Author_Institution :
Waseda University
Keywords :
Aluminum; Anodes; Argon; Electric breakdown; Electrodes; Gold; Plasma measurements; Plasma properties; Polymer films; Tunneling;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1991. CEIDP. 1991 Annual Report. Conference on
DOI :
10.1109/CEIDP.1991.763342
