DocumentCode
2782560
Title
Dispatching Rules For Semiconductor Testing Operations: A Computational Study
Author
Uzsoy, Reha ; Church, Laura K. ; Ovacik, Irfan M. ; Hinchman, Jim
Author_Institution
Purdue University
fYear
1992
fDate
28-30 Sep 1992
Firstpage
272
Lastpage
276
Keywords
Automatic testing; Circuit testing; Dispatching; Integrated circuit testing; Job shop scheduling; Packaging; Performance evaluation; Semiconductor device testing; Temperature; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN
0-7803-0755-0
Type
conf
DOI
10.1109/IEMT.1992.639903
Filename
639903
Link To Document