• DocumentCode
    2782837
  • Title

    Tip-to-sample distance control in apertureless near-field optical microscopy

  • Author

    Milner, A.A. ; Zhang, Kaiyin ; Prior, Yehiam

  • Author_Institution
    Department of Chemical Physics, Weizmann Institute of Science, Rehovot, 76100 Israel
  • fYear
    2007
  • fDate
    6-11 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered.
  • Keywords
    Atom optics; Atomic force microscopy; Force feedback; Force measurement; Optical control; Optical feedback; Optical microscopy; Optical sensors; Probes; Resonance light scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2007. QELS '07
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    978-1-55752-834-6
  • Type

    conf

  • DOI
    10.1109/QELS.2007.4431050
  • Filename
    4431050