DocumentCode
2782837
Title
Tip-to-sample distance control in apertureless near-field optical microscopy
Author
Milner, A.A. ; Zhang, Kaiyin ; Prior, Yehiam
Author_Institution
Department of Chemical Physics, Weizmann Institute of Science, Rehovot, 76100 Israel
fYear
2007
fDate
6-11 May 2007
Firstpage
1
Lastpage
2
Abstract
Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered.
Keywords
Atom optics; Atomic force microscopy; Force feedback; Force measurement; Optical control; Optical feedback; Optical microscopy; Optical sensors; Probes; Resonance light scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location
Baltimore, MD, USA
Print_ISBN
978-1-55752-834-6
Type
conf
DOI
10.1109/QELS.2007.4431050
Filename
4431050
Link To Document