• DocumentCode
    2782969
  • Title

    The importance of testing complex electronics

  • Author

    Sinnadurai, Nihal

  • Author_Institution
    Ambleside
  • fYear
    1992
  • fDate
    1992
  • Firstpage
    1
  • Lastpage
    12
  • Keywords
    Assembly; Circuit testing; Cost function; Electronic equipment testing; Integrated circuit interconnections; Integrated circuit testing; Logic testing; Samarium; System testing; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1992. IEMT 1992. 12th International
  • Print_ISBN
    0-7803-0629-5
  • Type

    conf

  • DOI
    10.1109/IEMT.1992.763391
  • Filename
    763391
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2782969