DocumentCode :
2782969
Title :
The importance of testing complex electronics
Author :
Sinnadurai, Nihal
Author_Institution :
Ambleside
fYear :
1992
fDate :
1992
Firstpage :
1
Lastpage :
12
Keywords :
Assembly; Circuit testing; Cost function; Electronic equipment testing; Integrated circuit interconnections; Integrated circuit testing; Logic testing; Samarium; System testing; Ultra large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1992. IEMT 1992. 12th International
Print_ISBN :
0-7803-0629-5
Type :
conf
DOI :
10.1109/IEMT.1992.763391
Filename :
763391
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2782969
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