• DocumentCode
    2783005
  • Title

    Characterization of nonlinear absorption in femtosecond laser inscription

  • Author

    Okhrimchuk, A. ; Mezentsev, V. ; Schmitz, H. ; Dubov, M. ; Bennion, I.

  • Author_Institution
    Photonics Res. Group, Aston Univ., Birmingham, UK
  • fYear
    2009
  • fDate
    14-19 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Permanent micro-modification of refractive index in dielectrics by means of femtosecond laser pulses is a novel enabling technology in photonics. A wide range of photonic structures manufactured using this method has been recently demonstrated. Nonlinear absorption is a crucial mechanism of efficient energy deposition at the spatial scale down to a fraction of laser wavelength. Two main distinct nonlinear absorption processes are relevant in femtosecond energy deposition and inscription process: multi-photon absorption (MPA) and plasma absorption (PA) due to resistive dissipation in generated electron-hole plasma. Understanding of the relative contribution of these mechanisms is ultimately required for optimization of the inscription procedures. This paper presents detailed experimental characterization of nonlinear absorption and fit numerically the model parameters.
  • Keywords
    high-speed optical techniques; laser beam effects; laser materials processing; light absorption; dielectric refractive index; femtosecond energy deposition; femtosecond laser inscription; inscription process; multi-photon absorption; nonlinear absorption; plasma absorption; refractive index micromodification; Absorption; Dielectrics; Manufacturing; Numerical models; Optical pulses; Photonics; Plasma materials processing; Plasma waves; Pulsed laser deposition; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-4079-5
  • Electronic_ISBN
    978-1-4244-4080-1
  • Type

    conf

  • DOI
    10.1109/CLEOE-EQEC.2009.5191926
  • Filename
    5191926