Title :
Automatic gang bonding, the alternative process
Author :
Schiebel, Gunter
Author_Institution :
Siemens AG
Keywords :
Bonding; Inspection; Laser beams; Lead; Position measurement; Printers; Quality assurance; Semiconductor device measurement; Signal resolution; Vacuum systems;
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1992. IEMT 1992. 12th International
Print_ISBN :
0-7803-0629-5
DOI :
10.1109/IEMT.1992.763405