DocumentCode
278342
Title
Design for probabilistic testing
Author
Narraway, John
Author_Institution
New Brunswick Univ., Fredericton, NB, Canada
fYear
1991
fDate
33374
Firstpage
42522
Lastpage
42525
Abstract
Probabilistic diagnosis can be used against intermittent faults, since it uses only data associated with faulty system operation. Also, the procedure can use on-line system data as diagnostic objects. It is thus suitable for incorporation into systems for use during normal operation, and in particular therefore, in intentionally-designed fault-tolerant systems. Probabilistic diagnosis is described with respect to bus faults, instruction faults, switching system faults and system architecture faults
Keywords
VLSI; fault tolerant computing; integrated circuit testing; bus faults; design for testability; diagnostic objects; fault-tolerant systems; instruction faults; intermittent faults; probabilistic testing; switching system faults; system architecture faults; use during normal operation;
fLanguage
English
Publisher
iet
Conference_Titel
Design for Testability, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
181577
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