DocumentCode
278348
Title
IEE Colloquium on `Design for Testability´ (Digest No.102)
fYear
1991
fDate
33374
Abstract
The following topics were dealt with: design for testability; VLSI IC testing; test pattern generation; probabilistic testing; hierarchical path sensitisation; and CAD
Keywords
VLSI; automatic test equipment; digital integrated circuits; integrated circuit testing; logic CAD; CAD; VLSI IC testing; design for testability; hierarchical path sensitisation; probabilistic testing; test pattern generation;
fLanguage
English
Publisher
iet
Conference_Titel
Design for Testability, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
181583
Link To Document