Title :
A probabilistic approach to reflector sidelobe degradation due to random surface errors
Author :
Ling, Hao ; Lo, Yuen T. ; Rahmat-Samii, Yahya
Author_Institution :
University of Illinios, Urbana, IL, USA
Keywords :
Antenna radiation patterns; Computer errors; Degradation; Error analysis; Laboratories; Manufacturing; Probability distribution; Propulsion; Space technology; Statistical distributions;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1985
Conference_Location :
Vancouver, Canada
DOI :
10.1109/APS.1985.1149565
