Title :
A PCDA-Based Critical Exception Management System in Semiconductor Industry
Author :
Kao, Yung-Wei ; Lin, Chia-Feng ; Cheng, Kun-Yao ; Yuan, Shyan-Ming ; Tsai, Ching-Tsorng
Author_Institution :
Dept. of Comput. Sci. & Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
After the global economic crisis, enterprises tend to lower their operating cost to improve their competitive advantages. Among different kinds of operating costs, lowering manufacturing cost brings the most significant effect. Among different manufacturing processes, not only the correctness and efficiency during producing products, but also those losses and expenses result from critical exception of product quality should be considered. The paper proposes a PDCA-based system for handling exception management process after critical exceptional events occurred. By facilitating managers to convene Material Review Board (MRB) meeting of critical exceptions, to manage and trace actions, and to constructing exception handling knowledge base, recurrence rate can be decreased after the efficiency of exception handling process is enhanced. Moreover, with completely recorded losses and costs, managers can manage enterprise resources in a more efficient way.
Keywords :
exception handling; manufacturing processes; quality assurance; quality control; semiconductor industry; strategic planning; PCDA based critical exception management system; Plan Do Check Act; exception handling knowledge base; global economic crisis; manufacturing process; material review board meeting; product quality; semiconductor industry; Book reviews; Companies; Manufacturing; Materials; Quality control; Servers; MRB; PDCA;
Conference_Titel :
Cyber-Enabled Distributed Computing and Knowledge Discovery (CyberC), 2010 International Conference on
Conference_Location :
Huangshan
Print_ISBN :
978-1-4244-8434-8
Electronic_ISBN :
978-0-7695-4235-5
DOI :
10.1109/CyberC.2010.82