Title :
Internal waveform probing of MMIC power amplifiers
Author :
Hwang, James C M
Author_Institution :
Lehigh Univ., Bethlehem, PA, USA
Abstract :
A microwave waveform internal probing technique for MMICs under normal CW or pulsed operation is described. The application to HBT and HEMT power amplifiers are demonstrated. The present high-impedance probing approach is compared to optical probing techniques
Keywords :
MMIC power amplifiers; integrated circuit testing; microwave measurement; probes; CW operation; HBT power amplifiers; HEMT power amplifiers; MMIC power amplifiers; high-impedance probing; internal waveform probing; microwave waveform internal probing technique; pulsed operation; MMICs; Optical amplifiers; Optical devices; Optical sensors; Power amplifiers; Probes; Pulse amplifiers; Sampling methods; Testing; Voltage;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2000, 2nd International Conference on. ICMMT 2000
Conference_Location :
Beijing
Print_ISBN :
0-7803-5743-4
DOI :
10.1109/ICMMT.2000.895768
