DocumentCode :
2784208
Title :
Accurate ILS and MLS performance evaluation in presence of site errors
Author :
Mahapatra, Pravas R. ; Poulose, M.M.
Author_Institution :
Dept. of Aerosp. Eng., Indian Inst. of Sci., Bangalore, India
fYear :
1989
fDate :
22-26 May 1989
Firstpage :
167
Abstract :
A powerful and versatile analytical approach is outlined for performing the site evaluation of instrument landing systems (ILS) and microwave landing systems (MLS) without resorting to the current experimental methods. The problem is treated as one of scattering, using a ray-theoretic approach. A multiwedge model of the terrain ahead of the antenna assembly is generated from standard survey data and an exact ray-tracing procedure is evolved to trace all the rays between the antenna elements and approaching aircraft. The power of the current uniform diffraction theory (UTD) to evaluate scattered fields from wedges is extended to include the impedance and roughness of the wedge, and the theory is applied to the multiwedge terrain model for evaluating the field. The results are reduced to a form compatible with ICAO (International Civil Aviation Organization) specified tests and compared with experimental data from real airports
Keywords :
aerospace computing; aerospace simulation; electromagnetic fields; electromagnetic interference; electromagnetic wave scattering; ground support systems; signal detection; standards; ICAO; ILS; International Civil Aviation Organization; MLS; aircraft; antenna; impedance; instrument landing systems; microwave landing systems; multiwedge model; ray-tracing; roughness; scattering; site errors; site evaluation; standard survey data; terrain; uniform diffraction theory; wedges; Aircraft; Assembly; Instruments; Microwave theory and techniques; Multilevel systems; Performance analysis; Performance evaluation; Power system modeling; Ray tracing; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National
Conference_Location :
Dayton, OH
Type :
conf
DOI :
10.1109/NAECON.1989.40208
Filename :
40208
Link To Document :
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