• DocumentCode
    2784234
  • Title

    Implementaion of nanoclusters in intermediate reflective layers

  • Author

    Ponomarev, M.V. ; Beyene, H.T. ; Creatore, M. ; van de Sanden, Mauritius C. M.

  • Author_Institution
    Dept. of Appl. Phys., Eindhoven Univ. of Technol., Eindhoven, Netherlands
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    The photon management plays a crucial role in thin film single junction or tandem silicon solar cells. Light trapping by means of metal nanoparticles (NPs) opens up a wide range of ways to improve solar cell efficiency due to plasmonic- enhanced light scattering at the metal-dielectric interface. In particular, combination of plasmonic light scattering at the interface between the intermediate reflective layer (IRL) and microcrystalline Si in micromorph tandem solar cells can lead to an efficient light trapping of the low energy photons in the microcrystalline silicon. We used a remote Expanding Thermal Plasma (ETP) in combination with magnetron sputtering to deliver metallic NPss with controlled size and density (size range 30-150 nm, below the percolation threshold). The ETP was also used to deposit thin ZnO of about 130 nm, to serve as IRL. In this work copper and silver NPs are implemented in the IRL with the purpose of enhancing forward scattering towards μc-Si:H and backward scattering towards α-Si:H in micromorpho solar cells. The NPs were implemented in two configurations, i.e.-between the substrate and IRL and on top of the IRL deposited on glass substrate. Surface morphology and metallic nanoparticle size are characterized by means of AFM, SEM, TEM, and correlated with surface plasmon effects. Characteristic haze up to 35% was measured in the range of 400-2500 nm showing high scattering efficiency of the wavelength above 600 nm. The scattering efficiency shifts to the higher wavelength range along with an increase in peak amplitude as the particle size increases.
  • Keywords
    elemental semiconductors; light scattering; nanoparticles; plasmonics; silicon; solar cells; surface morphology; surface plasmons; AFM; SEM; Si; TEM; backward scattering; expanding thermal plasma; forward scattering; glass substrate; intermediate reflective layers; light trapping; magnetron sputtering; metal nanoparticles; metal-dielectric interface; metallic nanoparticle size; microcrystalline; nanoclusters; plasmonic-enhanced light scattering; solar cell efficiency; surface morphology; surface plasmon; tandem silicon solar cells; thin film single junction; Copper; Optical surface waves; Photovoltaic cells; Plasmons; Scattering; Sputtering; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5617042
  • Filename
    5617042