• DocumentCode
    2784394
  • Title

    Limiting Optimism: Time or Event Count?

  • Author

    Abu-Ghazaleh, Nael B. ; Linderman, Richard

  • Author_Institution
    Comput. Sci. Dept., Binghamton Univ., NY
  • fYear
    2006
  • fDate
    2-4 Oct. 2006
  • Firstpage
    253
  • Lastpage
    256
  • Abstract
    In optimistically synchronized parallel discrete event simulators, unlimited optimism can lead to excessive rollbacks and simulation thrashing. Artificially throttling the simulation is a well-known technique for improving the performance by avoiding the effects of uncontrolled optimism. Simulation throttling has been attempted based on time or event count beyond global virtual time (GVT). In this paper, we carry out a simulation study of both approaches within time warp as well as breathing time warp (BTW) synchronization algorithms in the context of the SPEEDES simulation framework. We discover that anomalies arise when limiting optimism based on event count (as is the case in the default SPEEDES BTW algorithm) and that this gives rise to forced rollbacks that generally do not arise without simulation throttling. We implement a version of BTW that limits optimism based on time beyond GVT and show that it outperforms BTW for two large scale applications. We discuss initial experiences with adaptively estimating the optimism limit
  • Keywords
    distributed algorithms; parallel processing; synchronisation; time warp simulation; SPEEDES BTW algorithm; SPEEDES simulation framework; breathing time warp synchronization algorithms; distributed algorithm; event count; global virtual time; optimistically synchronized parallel discrete event simulation; time count; Application software; Computational modeling; Computer science; Context modeling; Delay; Discrete event simulation; Large-scale systems; Protocols; Telecommunication computing; Time warp simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Distributed Simulation and Real-Time Applications, 2006. DS-RT'06. Tenth IEEE International Symposium on
  • Conference_Location
    Terremolinos
  • ISSN
    1550-6525
  • Print_ISBN
    0-7695-2697-7
  • Type

    conf

  • DOI
    10.1109/DS-RT.2006.21
  • Filename
    4020810