Title :
Observing nonspecular reflection of a light beam
Author :
Woerdman, J.P. ; Merano, M. ; Aiello, A. ; van Exter, M.P.
Author_Institution :
Huygens Lab., Leiden Univ., Leiden, Netherlands
Abstract :
This article presents the first experimental demonstration of this effect in the optical domain; it may affect all kinds of optical angular metrology, e.g. in Michelson interferometers and in cantilever-based surface probe microscopies as AFM.
Keywords :
geometrical optics; light interferometry; light reflection; geometrical optics; light beam; nonspecular reflection; optical angular metrology; optical domain; surface probe microscopy; Acoustic beams; Dielectrics; Geometrical optics; Mirrors; Optical interferometry; Optical reflection; Optical refraction; Optical sensors; Reflectivity; Resonance;
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
DOI :
10.1109/CLEOE-EQEC.2009.5191997
