Title :
Voltage life characteristics of XLPE
Author :
Kitai, Shigeru ; Asai, Shinya ; Hirotsu, Kenichi
Author_Institution :
Sumitomo Electric Industries, Ltd.
Keywords :
Aging; Breakdown voltage; Cable insulation; Copper; Curing; Life testing; Semiconductor impurities; Semiconductor materials; Sheet materials; Temperature;
Conference_Titel :
Electrical Insulating Materials, 1988. Proceedings of the Twenty-First Symposium on
Print_ISBN :
4-88686-041-9
DOI :
10.1109/ISEIM.1988.763490
