DocumentCode :
2784792
Title :
Light scattering at nano-textured surfaces in thin film silicon solar cells
Author :
Haug, F.-J. ; Battaglia, C. ; Dominé, D. ; Ballif, C.
Author_Institution :
Photovoltaics & Thin Film Electron. Lab., Ecole Polytech. Fed. de Lausanne (EPFL), Neuchâtel, Switzerland
fYear :
2010
fDate :
20-25 June 2010
Abstract :
State-of-the-art solar cells based on thin film silicon make use of random textures for absorption enhancement; in the past, the development of these textures was carried out empirically, and in most applications this is still the case. Attempts to understand light scattering at the internal interfaces rely on quantities like haze and angle resolved scattering that are only measurable in air and need to be extrapolated, normally by means of scalar scattering theory. In this context it is unfortunate that the description of scattering into air requires modifications with empiric parameters whose scaling is unknown. We present an alternate approach for predicting angular properties and intensities of scattered light which is based only on measurable quantities like the surface morphology and the refractive index dispersion, no adjustable parameters are needed.
Keywords :
elemental semiconductors; light scattering; nanostructured materials; refractive index; silicon; solar cells; surface morphology; absorption enhancement; angle resolved scattering; angular properties; internal interfaces; light scattering; nanotextured surfaces; refractive index dispersion; scalar scattering theory; scattered light intensity; surface morphology; thin film silicon solar cells; Light scattering; Optical surface waves; Silicon; Surface morphology; Surface texture; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5617091
Filename :
5617091
Link To Document :
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