• DocumentCode
    2784892
  • Title

    Design of a functional rare earth oxide up-conversion layer for bulk silicon cells

  • Author

    Clark, Andrew ; Williams, David ; Arkun, Erdem ; Smith, Robin ; Semans, Scott ; Jamora, Aleta

  • Author_Institution
    Translucent Inc., Palo Alto, CA, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    Upconversion materials are typically tested using around 5mW of 1530nm laser illumination, which is equivalent to a solar concentration in excess of 1000 suns. An example of this can be found in where the NaYF:Er material is placed in proximity to a fully processed bifacial cell. Consequently the most obvious application for upconversion is to improve Si cells for use in low to medium concentrator photovoltaic (CPV) systems (2-300x). Previously we have demonstrated photocurrent via upconversion for a monolithically integrated rare earth oxide (REO) epitaxially grown on the front of a silicon test cell. The unique advantage arising from the integration of the REO directly onto the back of the silicon cell is that it can be processed using standard semiconductor techniques. This has the potential of lowering the cost of production because wafers could easily be scaled to 200mm diameter thereby accessing existing fabrication facilities. An increase in efficiency and a reduction in cost, presents an attractive opportunity for Si based photovoltaic (PV) and CPV.
  • Keywords
    elemental semiconductors; silicon; solar cells; NaYF:Er; bulk silicon cells; functional rare earth oxide up-conversion layer; laser illumination; medium concentrator photovoltaic systems; power 5 mW; solar concentration; upconversion materials; wavelength 1530 nm; Epitaxial growth; Photonics; Photovoltaic cells; Silicon; Sun; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5617094
  • Filename
    5617094