• DocumentCode
    2785054
  • Title

    Plasmonic light trapping for thin film A-SI:H solar cells

  • Author

    Ferry, Vivian E. ; Verschuuren, Marc A. ; Li, Hongbo B T ; Verhagen, Ewold ; Walters, Robert J. ; Schropp, Ruud E.I. ; Atwater, Harry A. ; Polman, Albert

  • Author_Institution
    Inst. Amolf, Amsterdam, Netherlands
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    Here we discuss the design, fabrication, and simulation of ultrathin film n-i-p a-Si:H solar cells incorporating light trapping plasmonic back reflectors which exceed the performance of n-i-p cells on randomly textured Asahi substrates. The periodic patterns are made via an inexpensive and scalable nanoimprint method, and are structured directly into the metallic back contact. Compared to reference cells with randomly textured back contacts and flat back contacts, the patterned cells exhibit higher short-circuit current densities and improved overall efficiencies than either reference case. Angle-resolved photocurrent measurements confirm that the enhanced photocurrents are due to coupling to waveguide modes of the cell. Electromagnetic modeling is shown to agree well with measurements, and used to understand further details of the device.
  • Keywords
    current density; hydrogen; plasmonics; radiation pressure; short-circuit currents; silicon; solar cells; thin films; Si:H; angle-resolved photocurrent measurements; flat back contacts; light trapping plasmonic back reflectors; metallic back contact; nanoimprint method; randomly textured back contacts; short-circuit current density; textured Asahi substrates; thin film solar cells; Absorption; Nanostructures; Photoconductivity; Photovoltaic cells; Semiconductor device measurement; Substrates; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5617101
  • Filename
    5617101