DocumentCode
2785096
Title
Comparison of photovoltaic module performance at Pu´u Wa´a Wa´a
Author
Busquet, Severine ; Torres, Jordan ; Dubarry, Matthieu ; Ewan, Mitch ; Liaw, Bor Yann ; Cutshaw, Larry ; Rocheleau, Richard
Author_Institution
Hawaii Natural Energy Inst., Univ. of Hawaii, Honolulu, HI, USA
fYear
2010
fDate
20-25 June 2010
Abstract
Hawaii is experiencing a substantial increase in grid-tied PV installations and utility companies are concerned with the resulting grid management issues. To address these concerns and to enable the utilities to make informed decisions, the Hawaii Natural Energy Institute (HNEI) of the University of Hawaii initiated a PV test program that provides high-resolution data to characterize module and array performance under a variety of local climatic conditions. In the first phase of the project HNEI developed a PV test bed located at Pu´u Wa´a Wa´a ranch on the Kona coast of the Big Island of Hawaii. Initially we selected seven different PV technologies for testing consisting of poly-crystalline, mono-crystalline, amorphous, and mixed technologies. The test modules comprise 200 W units, tilted at 20°, with maximum power point trackers, via small inverters connected to the grid or via charge controllers connected to a battery and load bank. The data is sampled at 1 Hz and stored in a database for visualization and analysis. This paper presents a description of the test bed design, the high data rate Data Acquisition System (DAS), and initial experimental results.
Keywords
photovoltaic power systems; power grids; power system management; solar cells; testing; amorphous module; array performance; data acquisition system; grid management issue; local climatic condition; mixed technology; module performance; monocrystalline module; photovoltaic module; polycrystalline module; power 200 W; utility company; Arrays; Companies; Electric variables measurement; Monitoring; Portals; Solar radiation; Variable speed drives;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5617104
Filename
5617104
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