DocumentCode :
2785254
Title :
Silicon quantum dots in an oxide matrix for third generation photovoltaic solar cells
Author :
Han, Lihao ; Wang, Jing ; Liang, Renrong
Author_Institution :
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear :
2010
fDate :
20-25 June 2010
Abstract :
The implementation of quantum dots in third generation solar cells will be of importance to enhance current transport mechanisms and quantum tunneling effects. In this study, it was demonstrated that silicon quantum dots with diameters of 3~8 nm in an oxide matrix were successfully fabricated. The quantum dots were produced by depositing an amorphous oxide matrix with a SiO target followed by annealing at different high temperatures. The morphological features of the oxide matrix were characterized. The optical properties were performed by Raman spectroscopy and photoluminescence spectrum respectively to confirm the effects of quantum dots. Reflectance spectrum displayed strong light absorption with wavelength higher than 550nm by the Si quantum dots, and XRD results demonstrated the crystallization phenomenon in the oxide matrix.
Keywords :
Raman spectroscopy; X-ray diffraction; amorphous semiconductors; annealing; elemental semiconductors; light absorption; photoluminescence; quantum dots; reflectivity; silicon; silicon compounds; solar cells; tunnelling; Raman spectroscopy; SiO; XRD; amorphous oxide matrix; annealing; current transport mechanisms; light absorption; photoluminescence spectrum; quantum dots; quantum tunneling effects; reflectance spectrum; third generation photovoltaic solar cells; Annealing; Facsimile;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5617112
Filename :
5617112
Link To Document :
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