Title :
Module Frequency And Noise Budget Limitations/tradeoffs In Multi-chip Modules As A Function Of CMOS Chips Integration
Author :
Senthinathan, R. ; Prince, J.L. ; Cangellaris, A.C.
Author_Institution :
University of Arizona, Tucson, AZ 85721
Keywords :
Clocks; Crosstalk; Equations; Frequency estimation; Immunity testing; Integrated circuit interconnections; Integrated circuit noise; Noise level; Voltage; Workstations;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN :
0-7803-0755-0
DOI :
10.1109/IEMT.1992.639918