Defect detection on patterned jacquard fabric

Author

Ngan, Henry Y T ; Pang, Grantham K H ; Yung, S.P. ; Ng, Michael K.

Author_Institution

Dept. of Electr. & Electron. Eng., Hong Kong Univ., China

fYear

2003

fDate

15-17 Oct. 2003

Firstpage

163

Lastpage

168

Abstract

The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.

Keywords

fabrics; filtering theory; image segmentation; inspection; textile industry; wavelet transforms; automated patterned fabric inspection machine; defect detection; defective region segmentation; filtering process; golden image subtraction; patterned jacquard fabric; textile industry; visual inspection method; wavelet transform; Fabrics; Fourier transforms; Geographic Information Systems; Histograms; Image segmentation; Inspection; Mathematics; Testing; Wavelet transforms; Wiener filter;

fLanguage

English

Publisher

ieee

Conference_Titel

Applied Imagery Pattern Recognition Workshop, 2003. Proceedings. 32nd

Print_ISBN

0-7695-2029-4

Type

conf

DOI

10.1109/AIPR.2003.1284266

Filename

1284266