Development of a test program to evaluate low temperature cofired ceramic MCMs incorporating buried capacitor and resistor components

Author

Barrett, J. ; Barton, J. ; Delaney, K. ; Doyle, R. ; Bertinet, J.P. ; Massoit, M. ; Cicognani, J. ; Polzer, E.

Author_Institution

National Microelectronics

fYear

1994

fDate

1994

Keywords

Capacitors; Ceramics; Conducting materials; Microelectronics; Nonhomogeneous media; Resistors; Temperature; Testing; Thermal stresses; Vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

MCM and VLSI Packaging Techniques and Manufacturing Technologies, 1994. Workshop on

Type

DOI

10.1109/WPTMT.1994.763532

Filename

763532

Link To Document