Title :
Development of a test program to evaluate low temperature cofired ceramic MCMs incorporating buried capacitor and resistor components
Author :
Barrett, J. ; Barton, J. ; Delaney, K. ; Doyle, R. ; Bertinet, J.P. ; Massoit, M. ; Cicognani, J. ; Polzer, E.
Author_Institution :
National Microelectronics
Keywords :
Capacitors; Ceramics; Conducting materials; Microelectronics; Nonhomogeneous media; Resistors; Temperature; Testing; Thermal stresses; Vehicles;
Conference_Titel :
MCM and VLSI Packaging Techniques and Manufacturing Technologies, 1994. Workshop on
DOI :
10.1109/WPTMT.1994.763532
