DocumentCode
2785484
Title
A study of the self-assembled mono-layer deposition process for the anti-adhesion of nano-imprint stamps
Author
Chen, Kuan-Wei ; Lin, Hung-Yi ; Fuh-Yu Chang ; Chan, Shuo-Hung ; Wu, Tung-Chuan ; Lin, Jen-Fin
Author_Institution
Department of Mechanical Engineering, National Cheng Kung University, Tainan, Taiwan 701, ROC
Volume
2
fYear
2006
fDate
17-20 June 2006
Firstpage
592
Lastpage
594
Abstract
The adhesion phenomenon of nano-imprint stamps will inevitably be one of the key issues for industrial applications of nano-imprint processes. The study of processes involving application of a thin film of chlorosilane on the surface of stamp that then attracts more and more attentions has resulted in documentation of promising solutions. However, the deposition of chlorosilane must be at under water-free atmosphere in order to achieve positive results. This study described below involves using a vacuum chamber and heating system designed to rapidly deposit high quality chlorosilane film onto silicon and nickel-based stamps through the vapor phase deposition method. The quality of anti-adhesion of the coated stamps has been investigated by imprinting experiments. The contact angles of the coated stamps after hundreds of imprints remain nearly the same as those of the as-deposited stamps.
Keywords
anti-adhesion; chlorosilane; nano-imprint; stamp; Adhesives; Atmosphere; Bonding; Heating; Mechanical engineering; Polymers; Self-assembly; Silicon; Vacuum systems; Water storage; anti-adhesion; chlorosilane; nano-imprint; stamp;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
Print_ISBN
1-4244-0077-5
Type
conf
DOI
10.1109/NANO.2006.247722
Filename
1717172
Link To Document