DocumentCode :
2785831
Title :
Simulation of positive corona discharge in SF6 gas by multichannel model
Author :
Okabe, Shozo ; Hara, Tsunenari ; Takaaki, Furuhata
Author_Institution :
Dept. of Electr. Eng., Tokai Univ., Kanagawa, Japan
Volume :
2
fYear :
1996
fDate :
16-19 Jun 1996
Firstpage :
810
Abstract :
R. Morrow (1991) has simulated the positive corona discharge of SF 6 gas by using the flux-corrected transport (FCT) method for one-dimensional continuity equations in which a single channel model was applied and only the longitudinal drift of charged particles and diffusion of electrons was considered. In this work, the authors simulate the discharge phenomena of the SF6 gas using a model that considers both of the longitudinal and the transverse diffusion of electrons and the bidirectional drift of charged particles. They adopt a multichannel model: a double channel model; and a triple channel model. They expand the continuity equations by considering the conditions mentioned above and also take account or the photoionization process in the equations. Then they apply the FCT method to the multichannel model. The result of simulation based on the triple channel model shows that charged particles move actively within a certain radius. The simulation results using the multichannel model are a better approximation to the actually measured waveform of corona pulse current than those of the single channel model
Keywords :
SF6 insulation; approximation theory; corona; electric breakdown; photoionisation; SF6; SF6 gas; discharge phenomena; discharge simulation; double channel model; flux-corrected transport method; longitudinal electron drift; multichannel model; one-dimensional continuity equations; positive corona discharge; transverse electron diffusion; triple channel model; Computational modeling; Corona; Current measurement; Discharges; Electrodes; Electrons; Equations; Ionization; Pulse measurements; Sulfur hexafluoride;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
Conference_Location :
Montreal, Que.
ISSN :
1089-084X
Print_ISBN :
0-7803-3531-7
Type :
conf
DOI :
10.1109/ELINSL.1996.549468
Filename :
549468
Link To Document :
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