DocumentCode :
2785872
Title :
Robust automatic target recognition using extra-trees
Author :
Pisane, Jonathan ; Marée, Raphael ; Wehenkel, Louis ; Verly, Jacques
Author_Institution :
Dept. Of Electr. Eng. & Comput. Sci., Univ. of Liege, Liège, Belgium
fYear :
2010
fDate :
10-14 May 2010
Firstpage :
1454
Lastpage :
1458
Abstract :
In this paper, we describe a new automatic target recognition algorithm for classifying SAR images based on the PiXiT image classifier. It uses randomized sub-windows extraction and extremely randomized trees (extra-trees). This approach requires very little pre-processing of the images, thereby limiting the computational load. It was successfully tested on an extended version of the public standard MSTAR database, that includes targets of interest, false targets, and background clutter. A misclassification rate of about three percent has been achieved. In this paper, we describe a new automatic target recognition algorithm for classifying SAR images based on the PiXiT image classifier. It uses randomized sub-windows extraction and extremely randomized trees (extra-trees). This approach requires very little pre-processing of the images, thereby limiting the computational load. It was successfully tested on an extended version of the public standard MSTAR database, that includes targets of interest, false targets, and background clutter. A misclassification rate of about three percent has been achieved.
Keywords :
image classification; radar clutter; radar imaging; synthetic aperture radar; trees (mathematics); MSTAR database; PiXiT image classifier; SAR image classification; extremely randomized trees; randomized subwindows extraction; robust automatic target recognition; Bioinformatics; Classification algorithms; Classification tree analysis; Clutter; Computer science; Image classification; Image databases; Robustness; Target recognition; Testing; ATR; Extremely randomized trees; MSTAR; PiXiT; SAR image classification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radar Conference, 2010 IEEE
Conference_Location :
Washington, DC
ISSN :
1097-5659
Print_ISBN :
978-1-4244-5811-0
Type :
conf
DOI :
10.1109/RADAR.2010.5494683
Filename :
5494683
Link To Document :
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