DocumentCode :
2786254
Title :
Measure your design value to improve it
Author :
Hassine, Amir ; Barke, Erich
Volume :
2
fYear :
2005
fDate :
Sept. 11-13, 2005
Firstpage :
668
Lastpage :
672
Keywords :
Chip scale packaging; Electronic design automation and methodology; Electronics industry; Manufacturing industries; Microelectronics; Production; Productivity; Semiconductor device measurement; Silicon; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering Management Conference, 2005. Proceedings. 2005 IEEE International
Print_ISBN :
0-7803-9139-X
Type :
conf
DOI :
10.1109/IEMC.2005.1559233
Filename :
1559233
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2786254
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