DocumentCode
2786254
Title
Measure your design value to improve it
Author
Hassine, Amir ; Barke, Erich
Volume
2
fYear
2005
fDate
Sept. 11-13, 2005
Firstpage
668
Lastpage
672
Keywords
Chip scale packaging; Electronic design automation and methodology; Electronics industry; Manufacturing industries; Microelectronics; Production; Productivity; Semiconductor device measurement; Silicon; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering Management Conference, 2005. Proceedings. 2005 IEEE International
Print_ISBN
0-7803-9139-X
Type
conf
DOI
10.1109/IEMC.2005.1559233
Filename
1559233
Link To Document