• DocumentCode
    2786327
  • Title

    Three-dimensional Nano Temperature Sensors fabricated using focused ion beam chemical vapour deposition

  • Author

    El-Shimy, Haitham M Magdy ; Arai, Fumihito ; Fukuda, Toshio

  • Author_Institution
    Dept. of Micro and Nano System Eng., Nagoya University, Nagoya, Japan, haitham@mein.nagoya-u.ac.jp
  • Volume
    2
  • fYear
    2006
  • fDate
    17-20 June 2006
  • Firstpage
    770
  • Lastpage
    772
  • Abstract
    In this work, we illustrate the fabrication of nano temperature sensors using focused ion beam chemical vapor deposition (FIB-CVD) of tungsten over atomic force microscope (AFM) cantilever, for sensing temperature distribution in local area. The FIB-CVD sensors were calibrated and the temperature coefficient of resistance shows positive characteristics. Building sensors by this approach is quite faster and easier to fabricate than other reported temperature sensing devices and can be modified to a mass production technique.
  • Keywords
    Foused ion beam; chemical vapor deposition; nanodevices; temperature coefficient of resistance; temperature sensors; tungsten; Atomic beams; Atomic force microscopy; Atomic layer deposition; Chemical sensors; Chemical vapor deposition; Fabrication; Ion beams; Sensor phenomena and characterization; Temperature sensors; Tungsten; Foused ion beam; chemical vapor deposition; nanodevices; temperature coefficient of resistance; temperature sensors; tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
  • Print_ISBN
    1-4244-0077-5
  • Type

    conf

  • DOI
    10.1109/NANO.2006.247771
  • Filename
    1717221