DocumentCode :
2786327
Title :
Three-dimensional Nano Temperature Sensors fabricated using focused ion beam chemical vapour deposition
Author :
El-Shimy, Haitham M Magdy ; Arai, Fumihito ; Fukuda, Toshio
Author_Institution :
Dept. of Micro and Nano System Eng., Nagoya University, Nagoya, Japan, haitham@mein.nagoya-u.ac.jp
Volume :
2
fYear :
2006
fDate :
17-20 June 2006
Firstpage :
770
Lastpage :
772
Abstract :
In this work, we illustrate the fabrication of nano temperature sensors using focused ion beam chemical vapor deposition (FIB-CVD) of tungsten over atomic force microscope (AFM) cantilever, for sensing temperature distribution in local area. The FIB-CVD sensors were calibrated and the temperature coefficient of resistance shows positive characteristics. Building sensors by this approach is quite faster and easier to fabricate than other reported temperature sensing devices and can be modified to a mass production technique.
Keywords :
Foused ion beam; chemical vapor deposition; nanodevices; temperature coefficient of resistance; temperature sensors; tungsten; Atomic beams; Atomic force microscopy; Atomic layer deposition; Chemical sensors; Chemical vapor deposition; Fabrication; Ion beams; Sensor phenomena and characterization; Temperature sensors; Tungsten; Foused ion beam; chemical vapor deposition; nanodevices; temperature coefficient of resistance; temperature sensors; tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
Print_ISBN :
1-4244-0077-5
Type :
conf
DOI :
10.1109/NANO.2006.247771
Filename :
1717221
Link To Document :
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