• DocumentCode
    2786501
  • Title

    Electrochemical nature of metal-insulator interfaces

  • Author

    Vijh, Ashok K.

  • Author_Institution
    Inst. de Recherche, Hydro-Quebec, Varennes, Que., Canada
  • Volume
    2
  • fYear
    1996
  • fDate
    16-19 Jun 1996
  • Firstpage
    870
  • Abstract
    At the interface between a metal and a dielectric (e.g., vacuum, sulfur hexafluoride, polymers, oils, detonated nitromethane, etc.) a variety of charge transfer events can take place which, basically, are electrochemical in nature. Such interfacial charge transfers are usually investigated by solid-state physicists and electrical engineers; for the fundamental understanding of the phenomena involved, it is necessary, however, to think of these interfacial charge transfers in the conceptual framework of electrochemical physics. Some typical cases of electrochemical processes at metal-dielectric interfaces are described. For example, metal-vacuum-metal sandwiches subjected to high-field dielectric breakdown can be shown to behave as metal-electrolyte-metal electrochemical cells. The field-induced dielectric breakdown of the vacuum creates a low-pressure plasma that acts as a gaseous electrolyte in that it contains ions and electrons that conduct electricity. The situation obtained at such interfaces is quite similar to that at metal-electrolyte interfaces
  • Keywords
    charge exchange; electrochemistry; electrolytes; metal-insulator boundaries; plasma production; vacuum breakdown; vacuum insulation; charge transfer events; electrochemical nature; electrochemical processes; electrons; field-induced dielectric breakdown; gaseous electrolyte; high-field dielectric breakdown; interfacial charge transfers; ions; low-pressure plasma; metal-dielectric interfaces; metal-electrolyte-metal electrochemical cells; metal-insulator interfaces; metal-vacuum-metal sandwiches; vacuum breakdown; Charge transfer; Dielectric breakdown; Electrochemical processes; Metal-insulator structures; Oils; Physics; Polymers; Solid state circuits; Sulfur hexafluoride; Vacuum breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-3531-7
  • Type

    conf

  • DOI
    10.1109/ELINSL.1996.549480
  • Filename
    549480