Title :
Charging characteristics of a few electron triple lateral quantum dot system in GaAs/AlGaAs
Author :
Studenikin, Sergei ; Gaudreau, Louis ; Sachrajda, Andy ; Zawadzki, Piotr ; Kam, Alicia ; Lapointe, Jean ; Korkusinski, M. ; Hawrylak, Pawel
Author_Institution :
Institute For Microstructural Sciences, NRC, Ottawa, Canada KIA 0R6, sergei.studenikin@nrc.ca
Abstract :
We report the first experimental realization of a semiconductor triple quantum dot system in a few electrons regime. Charging properties of this "artificial tri-atom" are studied using non-invasive charge detection technique. The most fundamental configuration was initialized in which a single electron is shared resonantly between the three dots and also equivalent arrangements involving two or three electrons. Using gates we are able to tune through the quadruple points, a unique feature of triple dot systems. At a quadruple point the quantum states in all three dots resonantly coincide with each other and with the chemical potential of the leads. Unexpectedly, novel charge re-arrangement lines were observed in vicinity of quadruple points. The observed charge re-arrangement can be viewed as a basic realization of quantum cellular automata in the few electron regime. Such phenomenon may be expected for all multiple quantum dot systems greater than two, in which a change in the state of one dot may instantaneously trigger a charge rearrangement of the system. The results may lead to new opportunities for fundamental physics research and for other applications, e.g. quantum computing.
Keywords :
Coulomb blockade; GaAs/AlGaAs; Quantum dots; q-bits; quantum cellular automata; quantum computing; triple-dot; Electrons; Gallium arsenide; Noise measurement; Physics computing; Quantum computing; Quantum dots; Resonance; Semiconductor device noise; Stability; US Department of Transportation; Coulomb blockade; GaAs/AlGaAs; Quantum dots; q-bits; quantum cellular automata; quantum computing; triple-dot;
Conference_Titel :
Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
Print_ISBN :
1-4244-0077-5
DOI :
10.1109/NANO.2006.247798