DocumentCode :
2787164
Title :
Towards A Better Understanding of Workload Dynamics on Data-Intensive Clusters and Grids
Author :
Li, Hui ; Wolters, Lex
Author_Institution :
Leiden Inst. of Adv. Comput. Sci., Leiden Univ.
fYear :
2007
fDate :
26-30 March 2007
Firstpage :
1
Lastpage :
10
Abstract :
This paper presents a comprehensive statistical analysis of workloads collected on data-intensive clusters and grids. The analysis is conducted at different levels, including virtual organization (VO) and user behavior. The aggregation procedure and scaling analysis are applied to job arrival processes, leading to the identification of several basic patterns, namely, pseudo-periodicity, long range dependence (LRD), and (multi)fractals. It is shown that statistical measures based on interarrivals are of limited usefulness and count based measures should be trusted instead when it comes to correlations. We also study workload characteristics like job run time, memory consumption, and cross correlations between these characteristics. A "bag-of-tasks" behavior is empirically proved, strongly indicating temporal locality. We argue that pseudo-periodicity, LRD, and "bag-of-tasks" behavior are important workload properties on data-intensive clusters and grids, which are not present in traditional parallel workloads. This study has important implications on workload modeling and performance predictions in data-intensive grid environments.
Keywords :
grid computing; human factors; pattern clustering; scheduling; statistical analysis; aggregation procedure; data-intensive clusters; data-intensive grid environments; job arrival processes; long range dependence; statistical analysis; user behavior; virtual organization; workload dynamics; Autocorrelation; Fractals; Parallel machines; Pattern analysis; Predictive models; Statistical analysis; Statistics; Supercomputers; Telecommunication traffic; Traffic control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel and Distributed Processing Symposium, 2007. IPDPS 2007. IEEE International
Conference_Location :
Long Beach, CA
Print_ISBN :
1-4244-0910-1
Electronic_ISBN :
1-4244-0910-1
Type :
conf
DOI :
10.1109/IPDPS.2007.370250
Filename :
4227978
Link To Document :
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