Title :
A novel readout IC with high noise immunity for charge-based touch screen panels
Author :
Yang, J.H. ; Jung, S.C. ; Woo, Y.J. ; Jeon, J.Y. ; Lee, S.W. ; Park, C.B. ; Kim, H.S. ; Ryu, S.T. ; Cho, G.-H.
Author_Institution :
KAIST, Daejeon, South Korea
Abstract :
The critical issues in charge-based touch screen panels for large size display are noise and speed. To solve these, this paper introduces a two-point relative sensing based `Delta-Integration´ scheme. It eliminates local noise and increases a readout difference between the touched and non-touched area. As a result, it can replace a high-resolution ADC with a comparator and counter. In addition, the single-bit conversion of Δ-integration method and the proposed wide-bandwidth charge amplifier solve a speed issue of a large display. The prototype chip is implemented in a 0.35-μm CMOS technology.
Keywords :
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); readout electronics; touch sensitive screens; CMOS technology; charge amplifier; charge-based touch screen panels; delta-integration scheme; high-resolution analog-digital converters; noise immunity; readout integrated circuits; size 0.35 mum; two-point relative sensing; Integrated circuits; Integrated optics; Noise; Optical sensors; Pixel; Radiation detectors;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2010 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-5758-8
DOI :
10.1109/CICC.2010.5617378
