DocumentCode :
2787329
Title :
Emission Intensity Improvement of InGaN Ultraviolet Light-Emitting Diodes Grown on Wet-Etched Sapphire Substrates
Author :
Pan, Chang-Chi ; Hsieh, Chi-Hsun ; Chyi, Jen-Inn
Author_Institution :
Optical Sciences Center and Department of Electrical Engineering, National Central University, Jhongli, Taiwan 32001, China
fYear :
2007
fDate :
6-11 May 2007
Firstpage :
1
Lastpage :
2
Keywords :
Dry etching; Epitaxial growth; Gallium nitride; Light emitting diodes; Optical pumping; Optical sensors; Power generation; Stimulated emission; Substrates; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
978-1-55752-834-6
Type :
conf
DOI :
10.1109/QELS.2007.4431326
Filename :
4431326
Link To Document :
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