DocumentCode
2787342
Title
Reliability of high power MQW-DFB-DC-PBH-LDs for Coherent Optical Communication System Application
Author
Kitamura, M. ; Yamazaki, H. ; Yamada, H. ; Takano, S. ; Kosuge, K. ; Yamaguchi, M. ; Mito, I.
Author_Institution
NEC CORP.
fYear
1992
fDate
21-25 Sept. 1992
Firstpage
260
Lastpage
261
Abstract
Result of aging test for 1.55/spl mu/m MQW-DFB-DC-PBH-LDs, in terms of spectral linewidth, FM characteristics and lasing wavelength, is reported. Over 10/sup 5/ hours reliability was estimated from long term aging and accelerated aging tests.
Keywords
Accelerated aging; Degradation; Frequency modulation; National electric code; Optical fiber communication; Power generation; Power system reliability; Quantum well devices; Testing; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Laser Conference , 1992. Conference Digest. 13th IEEE International
Conference_Location
Kagazwa, Japan
Print_ISBN
4-930813-51-4
Type
conf
DOI
10.1109/ISLC.1992.763662
Filename
763662
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