DocumentCode
2787368
Title
Carrier Concentration and Junction Temperature Dependencies of Illumination Efficiency of GaN Power Light-Emitting Diodes
Author
Liao, Michael P.
Author_Institution
Department of Electrical Engineering, DaYeh University, Chang-Hua, 515, Taiwan
fYear
2007
fDate
6-11 May 2007
Firstpage
1
Lastpage
2
Abstract
Pulsed drive currents have helped us separate the effects that junction temperature and carrier concentration have on current-induced efficiency degradation of GaN Power LEDs. Carrier concentration and junction temperature dependencies of illumination efficiency are presented.
Keywords
Degradation; Gallium nitride; Light emitting diodes; Lighting; Optical pulses; Optical sensors; Power generation; Temperature dependence; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location
Baltimore, MD, USA
Print_ISBN
978-1-55752-834-6
Type
conf
DOI
10.1109/QELS.2007.4431328
Filename
4431328
Link To Document