Title :
A V-band divide-by-three differential direct injection-locked frequency divider in 65-nm CMOS
Author :
Hsieh, Hsieh-Hung ; Hsueh, Fu-Lung ; Jou, Chewn-Pu ; Kuo, Fred ; Chen, Sean ; Yeh, Tzu-Jin ; Tan, Kevin Kai-Wen ; Wu, Po-Yi ; Lin, Yu-Ling ; Tsai, Ming-Hsien
Author_Institution :
Design Technol. Div., Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan
Abstract :
In this paper, a novel circuit topology of CMOS divide-by-three injection-locked frequency divider is demonstrated. By using a differential direct injection pair with a LC-tank oscillator, the proposed circuit can perform the division ratio of three while the wide locking range is obtained. Based on the presented circuit architecture, a V-band frequency divider is implemented in 65-nm CMOS for demonstration. Operated at a supply voltage of 1.0 V, the divider core consumes a dc power of 5.2 mW. At an incident power of 0 dBm, the fabricated circuit exhibits an input locking range from 58.6 to 67.2 GHz. The measured output power and locked phase noise at a 1-MHz offset are -10 dBm and -127 dBc/Hz, respectively. To the authors´ best knowledge, this work is the first CMOS V-band divide-by-three injection-locked frequency divider owning a locking range over 10% without any tuning mechanism reported to date.
Keywords :
CMOS integrated circuits; frequency dividers; injection locked oscillators; phase noise; CMOS V-band divide-by-three injection-locked frequency divider; CMOS divide-by-three injection-locked frequency divider; LC-tank oscillator; V-band divide-by-three differential direct injection-locked frequency divider; V-band frequency divider; circuit architecture; circuit topology; differential direct injection pair; fabricated circuit; input locking range; locked phase noise; power 5.2 mW; size 65 nm; supply voltage; tuning mechanism; voltage 1 V; Band pass filters; CMOS integrated circuits; Conferences; Frequency conversion; Frequency measurement; Phase noise;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2010 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-5758-8
DOI :
10.1109/CICC.2010.5617391