DocumentCode :
2787574
Title :
rPRAM: Exploring Redundancy Techniques to Improve Lifetime of PCM-based Main Memory
Author :
Chen, Jie ; Winter, Zachary ; Venkataramani, Guru ; Huang, H. Howie
Author_Institution :
Dept. of Electr. & Comput. Eng., George Washington Univ., Washington, DC, USA
fYear :
2011
fDate :
10-14 Oct. 2011
Firstpage :
201
Lastpage :
202
Abstract :
Future main memory systems will confront the scaling challenges posed by DRAM technology and should adapt themselves to use the emerging memory technologies like Phase Change Memory (PCM, or PRAM). PCM offers advantages such as storage density, non-volatility, and lower energy consumption. However, they are constrained by limited write endurance and reduced performance. In this paper, we propose a novel PCM-based main memory system, rPRAM, that explores advanced redundancy techniques to resuscitate faulty PCM pages and reuse these pages to store data. Our preliminary experiments show that rPRAM has the potential to extend the lifetime of PCM based memory commensurate with the existing schemes like ECP, while incurring only a negligible fraction of hardware cost compared to ECP.
Keywords :
DRAM chips; concurrency theory; multiprocessing systems; phase change memories; redundancy; DRAM technology; PCM-based main memory; faulty PCM page; lower energy consumption; phase change memory; rPRAM; redundancy technique; storage density; Hardware; Phase change materials; Phase change random access memory; Redundancy; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel Architectures and Compilation Techniques (PACT), 2011 International Conference on
Conference_Location :
Galveston, TX
ISSN :
1089-795X
Print_ISBN :
978-1-4577-1794-9
Type :
conf
DOI :
10.1109/PACT.2011.40
Filename :
6113815
Link To Document :
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