Title :
Modelling and Measurements on minimum-width transmission-lines from 10–67GHz in 65nm CMOS
Author :
van Zeijl, P.T.M. ; van der Zanden, H.T. ; Theunissen, B.B.A. ; Termeer, H.A.H.
Author_Institution :
Philips Res., Eindhoven, Netherlands
Abstract :
Transmission-line models for high-frequency wideband applications should preferably directly relate to the physical dimensions and effects. Various simulation modes (both linear and non-linear in the frequency- and time-domain) point towards the use of a straightforward model using frequency dependent resistances, inductances, and capacitances. However, not all simulators accept frequency dependent elements. This paper presents the design, characterisation and modelling results of 35, 50 and 70 ohm minimum-width transmission lines and 90 degree corners in the TSMC 65 nm process for high frequency (10-67 GHz) applications using frequency-independent elements.
Keywords :
CMOS integrated circuits; transmission line theory; CMOS technology; TSMC process; frequency 10 GHz to 67 GHz; frequency-independent element; high-frequency wideband application; minimum-width transmission line; resistance 35 ohm; resistance 50 ohm; resistance 70 ohm; size 65 nm; transmission-line model; Capacitance; Integrated circuit modeling; Loss measurement; Metals; Semiconductor device modeling; Transmission line measurements; Transmission lines;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2010 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-5758-8
DOI :
10.1109/CICC.2010.5617427
