• DocumentCode
    2788198
  • Title

    Spurious free time-to-digital conversion in an ADPLL using short dithering sequences

  • Author

    Waheed, Khurram ; Sheba, Mahbuba ; Staszewski, Robert Bogdan ; Dulger, Fikret ; Vamvakos, Socrates D.

  • Author_Institution
    Wireless RF-CMOS Radio Group, Texas Instrum., Dallas, TX, USA
  • fYear
    2010
  • fDate
    19-22 Sept. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper proposes an enhancement of the digital phase detection mechanism in an all-digital phase locked loop (ADPLL) operable at multi-GHz by randomization of the reference frequency phase by carefully chosen dither sequences. This renders the digital phase detector in ADPLL free from any phase domain spurious tones as a consequence of ill-conditioned sampling of variable oscillator phase in the time-to-digital converter (TDC). TDC has a typical time quantization in the range of 5 to 30 ps using modern deep sub-micron technologies. This finite dead-band can result in spurious tones, whenever an “integer” relationship arises between the oscillator phase and the TDC sampling process. This anomaly can be resolved using carefully selected spectrum-friendly dithering mechanisms. This work proposes injection of a short sequence dither signal into the reference signal to overcome the quantization introduced limit-cycles. This results in a robust phase tracking and spurious free operation of the ADPLL.
  • Keywords
    digital phase locked loops; phase detectors; ADPLL; all-digital phase locked loop; digital phase detection; short dithering sequences; spurious free time-to-digital conversion; Clocks; Converters; Delay; Frequency modulation; Noise; Phase locked loops; Quantization; All-digital PLL (ADPLL); dithering; limit cycles; phase error; quantization; short dither sequences; time-to-digital converter (TDC);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2010 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4244-5758-8
  • Type

    conf

  • DOI
    10.1109/CICC.2010.5617430
  • Filename
    5617430