Title :
0.18-V input charge pump with forward body biasing in startup circuit using 65nm CMOS
Author :
Chen, Po-Hung ; Ishida, Koichi ; Zhang, Xin ; Okuma, Yasuaki ; Ryu, Yoshikatsu ; Takamiya, Makoto ; Sakurai, Takayasu
Author_Institution :
Univ. of Tokyo, Tokyo, Japan
Abstract :
In this paper, a 0.18-V input three-stage charge pump circuit applying forward body bias is proposed. In the developed charge pump, all the MOSFETs are forward body biased by using the inter-stage/output voltages. By applying the proposed charge pump as the startup in the boost converter, the lower kick-up input voltage of the boost converter can be achieved. To verify the circuit characteristics, four test circuits have been implemented by using 65nm CMOS process. The measured available output current of the proposed charge pump under 0.18-V input voltage can be improved more than 150%. In addition, the boost converter can successfully been boosted from 0.18-V input to the 0.74-V output under 6mA output current. The proposed circuit is suitable for extremely low voltage applications such as harvesting energy sources.
Keywords :
CMOS analogue integrated circuits; charge pump circuits; power convertors; CMOS; MOSFET; boost converter; current 6 mA; energy sources; forward body biasing; size 65 nm; startup circuit; three-stage charge pump circuit; voltage 0.18 V; voltage 0.74 V; CMOS integrated circuits; Charge pumps; Clocks; Converters; Generators; MOSFETs; Voltage measurement;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2010 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-5758-8
DOI :
10.1109/CICC.2010.5617444