• DocumentCode
    2788466
  • Title

    Principles of femtosecond pulse tailoring for advanced material processing

  • Author

    Wollenhaupt, M. ; Englert, L. ; Sarpe-Tudoran, C. ; Baumert, T.

  • Author_Institution
    Inst. fur Phys. und CINSaT, Univ. Kassel, Kassel, Germany
  • fYear
    2009
  • fDate
    14-19 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Control of ionization processes with tailored femtosecond pulses is an important prerequisite for robust control of laser processing of high band gap materials. We make use of temporally asymmetric femtosecond pulses of identical fluence and identical pulse duration in order to control photo-ionization and electron-electron impact ionization. This results in observed different thresholds for material modification in fused silica as well as in reproducible lateral structures. Our strategy opens the route to develop tailored pulse shapes for controlled nanoscale material processing of dielectrics.
  • Keywords
    dielectric materials; high-speed optical techniques; impact ionisation; laser materials processing; optical control; optical materials; photoionisation; photonic band gap; robust control; silicon compounds; controlled nanoscale dielectric material processing; electron-electron impact ionization; femtosecond pulse tailoring; fused silica material modification; ionization process control; laser high-band gap material processing; photo-ionization control; robust control; temporally asymmetric femtosecond pulse; Dielectric materials; Impact ionization; Materials processing; Optical control; Optical materials; Optical pulses; Photonic band gap; Process control; Robust control; Shape control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-4079-5
  • Electronic_ISBN
    978-1-4244-4080-1
  • Type

    conf

  • DOI
    10.1109/CLEOE-EQEC.2009.5192210
  • Filename
    5192210