Title :
2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)
Abstract :
The papers presented can be grouped in the following categories: single event effects test results for a wide variety of digital devices, especially microprocessors and high-density memories, and for analog devices; total ionizing dose test results on a large number of commercial devices in ceramic and plastic packages; test results from radiation damage studies in photonic and opto-electronic devices such as optical fibers, lasers, optocouplers, and charge injection devices; descriptions of new facilities and tools for radiation effects studies; and results from space flight experiments to measure the space environment and to compare radiation effects in ground test with device behavior observed in flight
Keywords :
aerospace testing; analogue integrated circuits; digital integrated circuits; integrated circuit reliability; optoelectronic devices; packaging; radiation effects; space vehicle electronics; analog devices; ceramic packages; digital devices; flight tests; ground test; opto-electronic devices; photonic devices; plastic packages; radiation damage studies; radiation effects; radiation effects studies; single event effects; space environment; space flight experiments; total ionizing dose test results;
Conference_Titel :
Radiation Effects Data Workshop, 2000
Conference_Location :
Reno, NV, USA
Print_ISBN :
0-7803-6474-0
DOI :
10.1109/REDW.2000.896259
